Wednesday, 27 August 2003
10.74

This presentation is part of 10: WED-posters 12:00-2:00pm and 5:30-7:00pm

A UHV apparatus for soft x-ray spectroscopies with symmetry selection for solids and surfaces

Y. Takata1, T. Tokushima1, Y. Harada1, N. Kamakura1, Y. Kitajima2, M. Nagasono3, Y. Tamenori4, H. Ohashi3, A. Hiraya5, E. Ishiguro6, and S. Shin1. (1) RIKEN/SPring-8, Japan, (2) Institute of Materials Structure Science, Japan, (3) Kyoto Univ, Japan, (4) JASRI/SPring-8, Japan, (5) Hiroshima University, Japan, (6) University of the Ryukyus, Japan

We have constructed a UHV apparatus for soft x-ray spectroscopic studies of solids and surfaces at the beamline BL27SU in SPring-8. A newly developed flat field spectrometer with a CCD detector is equipped for soft x-ray emission spectroscopy (SXES). The focused beam, less than 10mm in vertical direction, enables us to take entrance slit away, and to achieve high detection efficiency without loss of incident beam. The energy resolution (E/DE) of 1000 is realized in the energy range of 200-900 eV. An electron energy analyzer, SES2002 (Gammadata Scienta), is also equipped for photoemission spectroscopy (PES). A novel undulator called gFigure-8h at this beamline supplies both horizontally and vertically polarized soft x-rays so that we can get symmetry resolved SXES and PES spectra by changing the polarization without rotating the spectrometer and the analyzer. We will show symmetry-resolved SXES and PES spectra, and discuss the advantage of the experimental configuration of the apparatus.


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